Custom-designed Optical Metrology Platforms
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omt’s customers can pick and choose from a number of optical measurement tools including:
- Thin Film Analysis (via Reflection/Transmission measurement heads)
- Videomicroscopes
- Ellipsometers
- Raman microscopes
- Photoluminescence/Electroluminescence measurement heads
- X-ray fluorescence (offered in collaboration with IFG GmbH in Berlin)
- Haze
4-Point-probes measurement tools (non-optical, contact measurement)
for integration in custom-designed, industrial, scanner systems (substrate dimensions up to 2m x 2m can be handled as well as any number of measurement heads). Protocols for equipment-to-host interfaces (SECS/GEM or Profibus) are available for complete factory integration packages. Contact our sales team about your special optical metrology needs: info@omt-instruments.com
For further information see MetrologyTool_Info.pdf or the site Optical Metrology Platform.
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