Visit us @ Intersolar Europe in Munich @ Hall A6 / Booth 136
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We are proud to introduce OMT’s newest metrology tool at the Intersolar 2012 (13 Jun.– 15 Jun. 2012):
a photoluminescence and electroluminescence (PL/EL) measurement system.
In addition to our Thin Film Analyzer (TFA) and industrial Raman microscope, the PL/EL measurement head has been specifically developed for in-line industrial applications. The PL/EL is an excellent tool for quality control for e.g. CIGS photovoltaic applications and can be integrated in our custom-designed scanners for fast, local-area, sample mapping.
Interested parties are invited to get hands-on experience with a wide variety of OMT’s metrology tools. In addition our experts will be on hand to provide advice for a variety of applications such as measurements of film thickness, Raman spectroscopy, sheet resistance, electroluminescence or photoluminescence in particular for in-line industrial applications.
Please contact us directly at info@omt-instruments.com to set up an appointment with our experts before the meeting, or during the meeting at our booth.
For information about the Intersolar please click http://www.intersolar.de.
