X-ray fluorescence (offered in collaboration with IFG GmbH in Berlin)
Haze
4-Point-probes measurement tools (non-optical, contact measurement) for integration in custom-designed, industrial, scanner systems (substrate dimensions up to 2m x 2m can be handled as well as any number of measurement heads). Protocols for equipment-to-host interfaces (SECS/GEM or Profibus) are available for complete factory integration packages. Contact our sales team about your special optical metrology needs: info@omt-instruments.com
omt – a German manufacturer of optical metrology tools for industrial applications -- introduces an industrial Raman microscope developed in collaboration with WITec Gmbh for non-destructive optical analysis of thin film composition. Currently the Raman microscope is incorporated in a number of factories for quality control of thin film CIGS photovoltaic production. Addition applications include monitoring of chemical components and contaminants during pharmaceutical production as well as controlling coatings on thin films for the polymer industry.
Visit omt (booth no. 611) at the MRS Fall Exhibition and Meeting (28 Nov.– 1 Dec. 2011) at the Hynes Convention Center in Boston, Massachusetts.
Interested parties are invited to get hands-on experience with our thin film analysis (TFA) device and to view a variety of products from our new industrial Raman microscope, custom-designed spectrometers, to a spectral ellipsometer. Our experts will be on hand to provide advice for a variety of applications such as measurements of film thickness, color or moisture content, and chemical composition in particular for laboratory and industrial applications.
Please contact us directly at info@omt-instruments.com to set up an appointment with our experts before the meeting, or during the meeting at our measurement stand.
Visit omt at the Intersolar Europe (08 Jun.– 10 Jun. 2011) at the Neue Messe München or at their homepage.
Interested parties are invited to get hands-on experience with our thin film photovoltaic metrology 2D scanner. In addition our experts will be on hand to provide advice for a variety of applications such as measurements of film thickness, Raman spectroscopy, sheet resistance, electroluminescence, or photoluminescence in particular for in-line industrial applications.
Please contact us directly at info@omt-instruments.com to set up an appointment with our experts before the meeting, or during the meeting at our booth.
Visit omt (booth # 613) at the MRS Fall Exhibition and Meeting (30 Nov.– 2 Dec. 2010) at the Hynes Convention Center in Boston, Massachusetts.
Interested parties are invited to get hands-on experience with our thin film analysis device and to view a variety of products from spectrometers to an ellipsometer. Our experts will be on hand to provide advice for a variety of applications such as measurements of film thickness, color or moisture content, in particular for laboratory and industrial applications.
Please contact us directly at info@omt-instruments.com to set up an appointment with our experts before the meeting, or during the meeting at our measurement stand.
omt optische messtechnik gmbh in Ulm, Germany is proud to present WITec, also from Ulm, as its new major holder. WITec is a world-leading manufacturer of high performance optical and scanning probe microscopy systems for research applications. With omt’s industrial expertise, these systems can now be utilized for in-line process control. Furthermore both omt and WITec will profit from the collaboration by consolidating their marketing activities.
“The beneficiaries of having WITec as a business partner are first and foremost our customers” says Dr. Matthias Eberhardt, Managing Director of omt. “Bringing together both companies’ technology and technical know-how will enable omt to design new state-of-the-art, multi-probe, optical metrology tools.”
“Our goal is the extension of our market-leading position in the field of 3D surface analysis. With the acquisition of a majority holding in omt we will be active in additional but distinct and vital sectors which will lead to further growth potential” says Dr. Joachim Koenen, Managing Director of WITec. “Especially in the fields of inline process control and industrial applications, omt will contribute significantly to a successful extension of our market share”.
About omt omt specializes in design and manufacturing of custom, precision and automated optical measurement systems for laboratory and industrial applications. The optical metrology tools are particularly strong in industrial process control of parameters such as film thickness, color, sheet resistance, moisture and chemical composition. For these types of measurements omt provides in-line and laboratory devices, leveraging techniques such as reflectometry, spectral ellipsometry, video microscopy, and spectroscopy. omt’s main customers are based in the automotive, glass, paper and solar industries as well as in highly sophisticated research laboratories.
About WITec WITec is a world-leading manufacturer of high performance optical and scanning probe microscopy systems. A modular product line allows the combination of different microscopy techniques such as Raman, SNOM or AFM in a single instrument for flexible analysis of the optical, chemical and structural properties of a sample. The instruments are distributed worldwide and are used primarily in the fields of Materials Science, Life Science and Nanotechnology. WITec is based in Ulm, Germany, with regional offices in Maryville, TN, USA and since May 2010 in Singapore.
Dr. Nancy Hecker-Denschlag joins Dr. Matthias Eberhardt as a Managing Director at omt - optical messtechnik gmbh. omt specializes in designing custom, precision, optical measurement solutions for industrial applications.
Dr. Hecker-Denschlag’s broad industrial experience as the Managing Director of the start-up company, Ionimed Analytik Gmbh in Innsbruck, Austria and as the System Design Authority (product development) for a DWDM optical data transport platform at Siemens AG will boost the organizational and technical expertise of omt. She has a PhD in physics from Harvard University and a B.S. in physics from University of Michigan.
Right: Dr. Matthias Eberhardt and Dr. Nancy Hecker-Denschlag
