Products
Measurement Systems
Modules
-
Raman Microscope for non-destructive analysis of chemical structure.
-
Utilizes reflection and/or transmission to determine film thickness, sheet resistance, band gap, color, moisture content, chemical composition, or index of refraction.
-
For sophisticated thin film analysis.
-
Imaging and mapping for all parameters measured by reflectometer.
-
Xenon or Mercury/Xenon based light sources combined with a variety of burners.
-
For applications requiring stable optical output from 360 nm to 2500 nm.
-
The ideal spectral calibration light source for UV - VIS range.
-
This low cost, high-quality and modular designed system can be easily customized for most UV-VIS-NIR applications.