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Spectral ellipsometry provides a very sensitive tool for thin film
analysis in many different applications. This includes for example the characterization
of semiconductor and dielectric materials, optical coating, coated surfaces in
biotechnology, surface chemistry, or material science.
omt develops and manufactures "easy-to-use"
spectroscopic ellipsometers which allow the characterization of thin films by this
powerful technology at reasonable costs.
Based on the mm-302 omt offers a variety of
customized solutions for specific requirements such as tranmission or imaging measurements.
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