mm-202 thin film analysis system

The mm-202 is a high performance, non-contact tabletop film thickness tool using white light reflection spectroscopy (reflectometry).
Soft- and hardware allow fully featured thin film analysis of single and multilayer thicknesses, and refractive indices.
It is available as a stand alone unit, or as an accessory for optical microscopes. The standard reflectometer has a spectral range from 450 to 900 nm, UV versions from 250 nm as well as NIR versions up to 1700 nm are available.

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